Industrial Strength.
Extreme industrial environments? No problem. The OT-4040 CPU and OT-4040 Target are built to withstand the rigors of day-to-day, on-the floor use.
An Ideal Laser Tracking/Optical Telescope Alternative.
Many consider laser trackers "too much solution" for alignment applications alone. Conversely, optical telescopes, with their slow and subjective performance, are often considered "too little solution". The OT-4040 provides the best of both worlds: it's exceptionally accurate, yet simple-to-operate and cost effective. Moreover, the OT-4040 system is optimized for instant, drop-in replacement of optical telescope systems via NAS standard housings. The overriding advantage is multipoint, dynamic, objective measurement - something neither laser trackers nor optical telescopes individually offer.
The Line Laser Advantage.
Laser based alignment provides significant advantages over competing alignment techniques.
Laser Alignment At A Glance
Extreme industrial environments? No problem. The OT-4040 CPU and OT-4040 Target are built to withstand the rigors of day-to-day, on-the floor use.
How Laser Alignment Works.
The principle of linear laser alignment is simple. A stationary laser, aimed at a reference target up to 300 feet away, creates a "line in space" that serves as a rock-solid measurement reference.
Next, one or more transparent targets are placed directly in the beam path. As the laser light passes through each transparent target, the target is able to determine the X-Y deviation of the
laser beam with respect to the center of the tooling sphere. Finally, this positioning information is output, in real-time, to a CPU for control, display and analysis. (An optional
Remote Data Terminal or computer can be used for data collection or remote operation.)
Two points in space define a line: position the laser so the beam is centered on targets #1 and #3. Now, move target #2 anywhere along the beam path to read X,Y deviation. The side view showsdeviation in the vertical (Y) direction; the top view shows deviation in the horizontal (X) direction.